Computer Science
A direct measure for the efficacy of Bayesian network structures learned from data
Document Type
Conference Paper
Abstract
Current metrics for evaluating the performance of Bayesian network structure learning includes order statistics of the data likelihood of learned structures, the average data likelihood, and average convergence time. In this work, we define a new metric that directly measures a structure learning algorithm's ability to correctly model causal associations among variables in a data set. By treating membership in a Markov Blanket as a retrieval problem, we use ROC analysis to compute a structure learning algorithm's efficacy in capturing causal associations at varying strengths. Because our metric moves beyond error rate and data-likelihood with a measurement of stability, this is a better characterization of structure learning performance. Because the structure learning problem is NP-hard, practical algorithms are either heuristic or approximate. For this reason, an understanding of a structure learning algorithm's stability and boundary value conditions is necessary. We contribute to state of the art in the data-mining community with a new tool for understanding the behavior of structure learning techniques. © Springer-Verlag Berlin Heidelberg 2007.
Publication Title
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Publication Date
2007
Volume
4571 LNAI
First Page
601
Last Page
615
ISSN
0302-9743
ISBN
9783540734987
DOI
10.1007/978-3-540-73499-4_45
Repository Citation
Holness, Gary F., "A direct measure for the efficacy of Bayesian network structures learned from data" (2007). Computer Science. 212.
https://commons.clarku.edu/faculty_computer_sciences/212
APA Citation
Holness, G. F. (2007, July). A direct measure for the efficacy of Bayesian network structures learned from data. In International Workshop on Machine Learning and Data Mining in Pattern Recognition (pp. 601-615). Berlin, Heidelberg: Springer Berlin Heidelberg.